Department of Electrical, Electronic, and Communication Engineering,
Faculty of Science and Engineering, Chuo University
Graduate School of Science and Engineering, Chuo University

TOPICS
2019 2018 2017 2016 2015 2014 2013 2012 2011
2010 2009 2008
2018
Mar07,19 Publications:
  • Yoshiki Takai, Mamoru Fukuchi, Reika Kinoshita, Chihiro Matsui and Ken Takeuchi
    “Analysis on Heterogeneous SSD Configuration with Quadruple-Level Cell (QLC) NAND Flash Memory”
    IEEE International Memory Workshop (IMW)
  • Toshiki Nakamura, Shun Suzuki and Ken Takeuchi
    “Data Pattern & Memory Variation Aware Fine-Grained ECC Optimized by Neural Network for 3D-TLC NAND Flash Memories with 2.0x Data-retention Time Extension and 30% Parity Overhead Reduction”
    IEEE International Memory Workshop (IMW)
  • Shouhei Fukuyama1, Atsuna Hayakawa1, Ryutaro Yasuhara2, Shinpei Matsuda1, Hiroshi Kinoshita1 and Ken Takeuchi1, 1Chuo University, Tokyo, Japan, 2Panasonic Semiconductor Solutions Co.,Ltd
    “Comprehensive Analysis of Data-retention and Endurance Trade-off of 40nm TaOX-based ReRAM”
    IEEE International Reliability Physics Symposium (IRPS)
  • Kyoji Mizoguchi, Kyosuke Maeda and Ken Takeuchi
    “Automatic Data Repair Overwrite Pulse for 3D-TLC NAND Flash Memories with 38x Data-retention Lifetime Extension”
    IEEE International Reliability Physics Symposium (IRPS)
  • Jan18,19 Publications:
  • Chihiro Matsui and Ken Takeuchi
    “Design of Heterogeneously-integrated Memory System with Storage Class Memories and NAND Flash Memories”
    Asia South Pacific Design Automation Conference University LSI Contest (ASP-DAC UDC) 2019
  • Oct05,18 Publications:
  • Ken Takeuchi
    “Data-aware Approximate Non-volatile Memories for Deep Neural Network”
    8th International Workshop on Resistive Memories <Invited Talk>
  • Oct02,18 Publications:
  • Shouhei Fukuyama1, Ryutaro Yasuhara2, Shinpei Matsuda1 and Ken Takeuchi1, 1Chuo University, Tokyo, Japan, 2Panasonic Semiconductor Solutions Co.,Ltd
    “Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify”
    Non-Volatile Memory Technology Symposium (NVMTS)
  • Atsuya Suzuki, Chihiro Matsui and Ken Takeuchi
    “Periodic Data Eviction Algorithm of SCM/NAND Flash Hybrid SSD with SCM Retention Time Constraint Capabilities at Extremely High Temperature”
    Non-Volatile Memory Technology Symposium (NVMTS)
  • Reika Kinoshita, Chihiro Matsui, Shinpei Matsuda, Yutaka Adachi and Ken Takeuchi
    “Maximizing Performance/Cost Figure of Merit of S-SCM-based SSD by Adding Small Capacity of M-SCM”
    Non-Volatile Memory Technology Symposium (NVMTS)
  • Kota Tsurumi, Kenta Suzuki and Ken Takeuchi
    “A 6.8TOPS/W Energy Efficiency, 1.5uW Power Consumption, Pulse Width Modulation Neuromorphic Circuits for Near-Data Computing with SSD”
    IEEE Asian Solid-State Circuits Conference (A-SSCC)
  • Ken Takeuchi
    “Intelligent storage for AI”
    IEEE Asian Solid-State Circuits Conference (A-SSCC) <Invited Talk>
  • Aug31,18 Publications:
  • Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura and Ken Takeuchi
    “Endurance-Based Dynamic VTH Distribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-Trap and Increase Data-Retention Time by 2.7x”
    European Solid-State Device Research Conference (ESSDERC)
  • Kazuki Maeda1, Shinpei Matsuda1, Ryutaro Yasuhara2 and Ken Takeuchi1, 1Chuo University, Tokyo, Japan, 2Panasonic Semiconductor Solutions Co.,Ltd
    “Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-Based ReRAM”
    European Solid-State Device Research Conference (ESSDERC)
  • Aug03,18 Publications:
  • Shun Suzuki, Toshiki Nakamura, Kyoji Mizoguchi and Ken Takeuchi
    “Horizontal Error Detection & Vertical LDPC ECC for Reliable 3D-TLC NAND Flash”
    Flash Memory Summit
  • Toshiki Nakamura and Ken Takeuchi
    “Artificial Neural Network Coupled LDPC ECC for 3D-NAND Flash Memories”
    Flash Memory Summit
  • Keita Mizushina, Toshiki Nakamura and Ken Takeuchi
    “Layer-by-layer Adaptively Optimized ECC for NAND Flash SSD Storing CNN Weights”
    Flash Memory Summit
  • Jun04,18 Publications:
  • Yusuke Yamaga, Yoshiaki Deguchi, Shohei Fukuyama and Ken Takeuchi
    “5x Reliability Enhanced 40 nm TaOx Approximate-ReRAM with Domain-Specific Computing for RealTime Image Recognition of IoT Edge Devices”
    IEEE Symposium on VLSI Technology and Circuits
  • Yoshiaki Deguchi and Ken Takeuchi
    “280x Data-retention Lifetime and 11x Write/Erase Endurance Enhancement of TLC NAND Flash memories storing Deep Neural Network Weight Data by Data Compression”
    IEEE Silicon Nanoelectoronics Workshop (SNW)
  • Yusuke Sugiyama, Chihiro Matsui and Ken Takeuchi
    “75% Performance Boost of RAID-5 Storage with SSDs by Garbage Collection Overhead Reduction for 3D NAND Flash Memory”
    IEEE Silicon Nanoelectoronics Workshop (SNW)
  • May11,18 Publications:
  • Yoshiaki Deguchi and Ken Takeuchi
    “3D-NAND Flash Solid-State Drive (SSD) for Deep Neural Network Weight Storage of IoT Edge Devices with 700x Data-retention Lifetime Extention”
    IEEE International Memory Workshop (IMW)
  • Yoshiaki Deguchi, Kazuki Maeda, Shun Suzuki, Toshiki Nakamura and Ken Takeuchi
    “Error-Reduction Controller Techniques of TaOx-based ReRAM for Deep Neural Networks to Extend Data-Retention Lifetime by Over 1700x”
    IEEE International Memory Workshop (IMW)
  • Apr17,18 Publications:
  • Kenta Suzuki, Masahiro Tanaka, Kota Tsurumi and Ken Takeuchi
    “43 % Reduced Program Time, 23 % Energy Efficient ReRAM Boost Converter with PMOS Switching Transistor and Boosted Buffer Circuit for ReRAM and NAND Flash Hybrid SSDs”
    IEEE International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC 2018)
  • Masaru Nakanishi, Yutaka Adachi, Chihiro Matsui, Yusuke Sugiyama and Ken Takeuchi
    “Application-oriented Wear-leveling Optimization of 3D TSV-integrated Storage Class Memory-based Solid State Drives”
    IEEE International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC 2018)
  • Apr2,18 Member list renewal

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