Department of Electrical, Electronic, and Communication Engineering,
Faculty of Science and Engineering, Chuo University
Graduate School of Science and Engineering, Chuo University

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2019
July16,19 Publications:
  • Chihiro Matsui, Shouhei Fukuyama, Atsuna Hayakawa and Ken Takeuchi
    “TaOx-based ReRAM for Variability-Aware Approximate Computing”
    Flash Memory Summit (FMS)
  • Reika Kinoshita, Chihiro Matsui and Ken Takeuchi
    “Maximizing Performance/cost of SSD composed of Memory-type and Storage-type SCMs”
    Flash Memory Summit (FMS)
  • Hiroshi Kinoshita, Shouhei Fukuyama, Tsubasa Yonai, Ryutaro Yasuhara and Ken Takeuchi
    “85% Endurance Error Reduction by Changing Reset Voltage in 40nm TaOX-based ReRAM”
    International Conference on Solid State Devices and Materials (SSDM)
  • Koki Kamimura, Susumu Nohmi, Kenta Suzuki and Ken Takeuchi
    “Parallel Product-Sum Operation Neuromorphic Systems with 4-bit Ferroelectric FET Synapses”
    European Solid-State Device Research Conference (ESSDERC)
  • May31,19 Publications:
  • Kyosuke Maeda, Kyoji Mizoguchi and Ken Takeuchi
    “Less Reliable Page Error Reduction for 3D-TLC NAND Flash Memories with Data Overhead Reduction by 40% and Data-retention Time Increase by 5.0x”
    Silicon Nanoelectronics Workshop (SNW)
  • Daiki Kojima, Toshiki Nakamura and Ken Takeuchi
    “Error Correction for Read-hot Data in 3D-TLC NAND Flash by Read-disturb Modeled Artificial Neural Network Coupled LDPC ECC”
    Silicon Nanoelectronics Workshop (SNW)
  • Masaki Abe, Toshiki Nakamura and Ken Takeuchi
    “Pre-Shipment Data-Retention/Read-Disturb Lifetime Prediction & Aftermarket Cell Error Detection & Correction by Neural Network for 3D-TLC NAND Flash Memory”
    Symposia on VLSI Technology and Circuits
  • Chihiro Matsui, Shouhei Fukuyama, Atsuna Hayakawa and Ken Takeuchi
    “Application-Induced Cell Reliability Variability-Aware Approximate Computing in TaOx-Based ReRAM Data Center Storage for Machine Learning”
    Symposia on VLSI Technology and Circuits
  • May24,19 Publications:
  • Chihiro Matsui and Ken Takeuchi
    “Self-Determining Resource Control in Multi-Tenant Data Center Storage with Future NV Memories”
    IEEE International Symposium on Circuits and Systems(ISCAS)
  • May10,19 Publications:
  • Chihiro Matsui and Ken Takeuchi
    “Workload-based Dynamic SCM Capacity Management of SCM/NAND Flash Hybrid Storage”
    IEEE Symposium on Low-Power and High-Speed Chips and Systems (COOL Chips 22)
  • Apr2,19 Member list renewal

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